Information
- Publication Type: Journal Paper with Conference Talk
- Workgroup(s)/Project(s):
- Date: April 2015
- Journal: Computer Graphic Forum
- Volume: 33
- Number: 3
- Note: appeared in June 2014
- Location: FH OÖ Campus Hagenberg
- Lecturer: Bernhard Fröhler
- ISSN: 2411-5428
- Event: 9. Forschungsforum der Österreichischen Fachhochschulen
- Conference date: 8. April 2015 – 9. April 2015
- Pages: 91 – 100
Abstract
An increasing number of industrial applications demand a comprehensive analysis of both structural and chemical composition. Typically, non-destructive testing techniques focus on either structural or chemical characterization but do not deliver both. 3D X-Ray Computed Tomography (XCT) scans are well-suited for determining the internal and external structure of an object at high resolution. The attenuation value it delivers can however be the same or very similar for different materials. For a detailed chemical analysis XCT is therefore combined with spectral characterization techniques such as K-Edge Absorptiometry or X-ray Fluorescence Spectroscopy. In this paper, we are extending a previously introduced framework for visualization and analysis of specimens scanned with these two modalities in multiple ways: For better understanding the dependencies between the spectral energy levels, we propose Spectral Similarity Maps. Spectral Functional Boxplots visualize the statistical distribution of the spectral data. The Spectrum Explor-er improves the analysis of specimens of unknown composition. We demonstrate the usefulness of our techniques on several use cases.Additional Files and Images
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BibTeX
@article{Froehler_Berhnard_2015_ESM, title = "Multimodal Visualization and Analysis of Spectral and XCT Data", author = "Bernhard Fr\"{o}hler and Artem Amirkhanov and Johann Kastner and Eduard Gr\"{o}ller and Christoph Heinzl", year = "2015", abstract = "An increasing number of industrial applications demand a comprehensive analysis of both structural and chemical composition. Typically, non-destructive testing techniques focus on either structural or chemical characterization but do not deliver both. 3D X-Ray Computed Tomography (XCT) scans are well-suited for determining the internal and external structure of an object at high resolution. The attenuation value it delivers can however be the same or very similar for different materials. For a detailed chemical analysis XCT is therefore combined with spectral characterization techniques such as K-Edge Absorptiometry or X-ray Fluorescence Spectroscopy. In this paper, we are extending a previously introduced framework for visualization and analysis of specimens scanned with these two modalities in multiple ways: For better understanding the dependencies between the spectral energy levels, we propose Spectral Similarity Maps. Spectral Functional Boxplots visualize the statistical distribution of the spectral data. The Spectrum Explor-er improves the analysis of specimens of unknown composition. We demonstrate the usefulness of our techniques on several use cases.", month = apr, journal = "Computer Graphic Forum", volume = "33", number = "3", note = "appeared in June 2014", issn = "2411-5428", pages = "91--100", URL = "https://www.cg.tuwien.ac.at/research/publications/2015/Froehler_Berhnard_2015_ESM/", }